WO2018152662A1 - Device and method for testing fingerprint sensor - Google Patents
Device and method for testing fingerprint sensor Download PDFInfo
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- WO2018152662A1 WO2018152662A1 PCT/CN2017/074198 CN2017074198W WO2018152662A1 WO 2018152662 A1 WO2018152662 A1 WO 2018152662A1 CN 2017074198 W CN2017074198 W CN 2017074198W WO 2018152662 A1 WO2018152662 A1 WO 2018152662A1
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- pressure
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
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- the present application relates to the field of fingerprint chip testing, and more particularly to an apparatus and method for testing a fingerprint chip.
- Embodiments of the present application provide an apparatus and method for testing a fingerprint chip, which can improve test accuracy.
- an apparatus for testing a fingerprint chip comprising: at least one test head, each test head comprising a dummy finger, a base and a spring, the spring being coupled between the analog finger and the base for Buffering the force of the first support portion on the simulated finger;
- the first support portion, the base in each test head is connected to the first support portion
- the first driving device is configured to drive the first supporting portion such that the analog finger in each test head applies pressure to the fingerprint chip corresponding to the position of the test head.
- the device for testing a fingerprint chip of the embodiment of the present application can compensate for the pressure difference caused by the surface condition of the chip and the tolerance of the fixture by using a spring structure with a suitable spring coefficient, so that when the whole board fingerprint chip is tested for pressing
- the pressure on a single chip on the whole board fingerprint chip can meet the test pressure accuracy, which can improve the test accuracy.
- the physical damage of the fingerprint chip can be avoided, and the requirement for the accuracy of the jig can be reduced.
- the first driving device is a hydraulic or pneumatic device.
- the pressure between the analog finger and the fingerprint chip can be guaranteed to be within a certain range, which can avoid the cumbersome procedure of the motor mode that needs to be calibrated, and can also reduce Requirements for structural accuracy.
- the spring constant of the spring in each test head satisfies the following formula at Kt:
- F1 is the maximum pressure that the fingerprint chip can withstand when the test pressure accuracy is met
- F2 is the minimum pressure that the fingerprint chip can withstand when the test pressure accuracy is met
- D is the test head and the bearing subjected to the minimum pressure. The stroke of the maximum pressure test head is in contact with the fingerprint chip.
- the compression length l of the spring satisfies the following formula:
- the compression length l of the spring indicates the length at which the spring in the test head subjected to the pressure F1 is compressed under the requirement of the test accuracy.
- the device may further include:
- a second driving device configured to apply pressure to the second supporting portion, such that the simulated finger in each test head contacts the fingerprint chip corresponding to the position of the test head, and the simulated finger in each test head Stopping driving the second support portion when contacting the fingerprint chip corresponding to the position of the test head, wherein the first driving device contacts the dummy chip in each test head when contacting the fingerprint chip corresponding to the position of the test head
- the first support portion is driven such that the analog finger in each test head applies pressure to the fingerprint chip corresponding to the position of the test head.
- the second drive device is a hydraulic or pneumatic device.
- the first driving device is a cylinder.
- the device may further include:
- a controller for controlling the first driving device and the second driving device to drive the first supporting portion and the second supporting portion, respectively.
- the second drive device is a cylinder.
- a method of testing a fingerprint chip is provided, the method being applicable to any of the possible implementations of the first aspect or the first aspect, the method comprising: the first driving device targeting Pressing the first support portion, the first pressure being equal to a product of a standard pressure and a number of test heads included in the at least one test head;
- Determining a pressure parameter corresponding to the fingerprint chip at the location of each test head the pressure parameter being used to indicate the amount of pressure experienced by the fingerprint chip at the location of each test head.
- the method for testing a fingerprint chip in the embodiment of the present application can compensate for the pressure difference caused by the surface condition of the chip and the tolerance of the fixture by using a spring structure with a suitable elastic modulus, thereby making a single chip on the whole fingerprint chip
- the pressure can withstand the test pressure accuracy, which can improve the test accuracy.
- the physical damage of the fingerprint chip can be avoided, and the requirement for the accuracy of the jig can be reduced.
- the first driving device is a hydraulic or pneumatic device.
- the spring coefficient of the spring in each test head satisfies the following formula at Kt:
- F1 is the maximum pressure that the fingerprint chip can withstand when the test pressure accuracy is met
- F2 is the minimum pressure that the fingerprint chip can withstand when the test pressure accuracy is met
- D is the test head that bears the minimum pressure and withstands the test. The stroke of the maximum pressure test head is in contact with the fingerprint chip.
- the compression length l of the spring satisfies the following formula:
- the compression length l of the spring indicates the length at which the spring in the test head subjected to the pressure F1 is compressed under the requirement of the test accuracy.
- the method may further include: applying, by the second driving device, pressure to the second support portion by using a second pressure to drive the analog finger in each test head and corresponding to the test head
- the fingerprint chip of the position contacts, and stops driving the second support portion when the dummy finger in each test head comes into contact with the fingerprint chip corresponding to the position of the test head.
- the second drive device is a hydraulic or pneumatic device.
- the pressure between the analog finger and the fingerprint chip can be guaranteed to be within a certain range, and the cumbersome procedure in which the motor mode needs to be calibrated can be avoided. It also reduces the requirement for structural accuracy.
- FIG. 1 is a schematic block diagram of an apparatus for testing a fingerprint chip in accordance with one embodiment of the present application.
- Figure 2 is a schematic diagram of the force of the chip under test.
- Figure 3 is another schematic diagram of the force of the chip under test.
- FIG. 4 is a schematic block diagram of an apparatus for testing a fingerprint chip in accordance with another embodiment of the present application.
- FIG. 5 is a schematic flow chart of a method for testing a fingerprint chip according to an embodiment of the present application.
- FIG. 1 is a schematic block diagram of an apparatus 100 for testing a fingerprint chip according to an embodiment of the present application. It should be understood that the apparatus for testing the fingerprint chip shown in FIG. 1 is only an example, and the apparatus for testing the fingerprint chip of the embodiment of the present application may further include other modules or units, or include functions of the respective modules in FIG. Similar modules, or not all of the modules in Figure 1.
- the device 100 includes at least one test head 110, a first support portion 120 and a first drive device 130.
- Each test head includes a simulated finger 101, a base 102 and a spring 103.
- the spring 103 is coupled between the dummy finger 101 and the base 102 for buffering the force of the first support portion 120 on the dummy finger 101.
- the base 102 in each test head is coupled to the first support portion 120.
- the first driving device 130 drives the first support portion 120 such that the analog finger 101 in each of the test heads applies pressure to the fingerprint chip corresponding to the position of the test head.
- test head 110 is detachable, and in use, the test head 110 can be mounted in a test head fixture (not shown) and coupled to the first support portion 120.
- the first support portion 120 can be part of the test head clamp or can be a separate component.
- the first driving device 130 drives the first supporting portion 120 to push the test head 110 out of the test head fixture, and simulates a finger to simulate a human hand pressing the fingerprint chip.
- test heads shown in FIG. 1 are merely illustrative and that the apparatus 100 may include more or fewer test heads as needed.
- the fingerprint chip production package is strip-shaped, the warpage caused by the cooling after the completion of the fingerprint chip package cannot be completely avoided, and the warpage may make the heights of the fingerprint chips inconsistent at various positions. That is, the height of a single fingerprint chip is inconsistent.
- the general machining can be guaranteed within ⁇ 0.01 mm (mm), but the tolerances of the components due to the multiple components of the fixture will accumulate, and the tolerance of the rubber due to material problems is also very It is difficult to guarantee, so there may be the possibility of tilt and unevenness.
- the first driving device 130 acts on the first The pressure of the support portion 120 should be 36N.
- the pressures of the four fingerprint chips corresponding to the four test heads from left to right are 13N, 7N, 3N, and 1.7N, respectively. Further, as shown in (b) of FIG. 2, the pressures of the four chips corresponding to the four test heads from left to right are 15N, 5N, 5N, and 15N, respectively. It can be seen that the warpage of the chip causes a large difference in the pressure of the test. After being compensated by the spring, as shown in (c) of FIG. 2, the pressures of the four fingerprint chips corresponding to the four test heads from left to right are 9N, 11N, 11N, and 9N, respectively. Therefore, the pressure difference caused by the warpage of the chip can be compensated by using a spring.
- the pressures of the four fingerprint chips corresponding to the four test heads from left to right are 3N, 7N, 13N, and 17N, respectively. Since the heights of the test heads are inconsistent, as shown in (b) of FIG. 3, the pressures of the four fingerprint chips corresponding to the four test heads from left to right are 15N, 5N, 15N, and 5N, respectively. It can be seen that the tolerances of the test head production and installation fixtures lead to a large difference in test pressure. After being compensated by the spring, as shown in (c) of FIG.
- the pressures of the four fingerprint chips corresponding to the four test heads from left to right are 11N, 9N, 9N, and 11N, respectively. Therefore, by using a spring, it is possible to compensate for the pressure difference caused by the production of the test head and the tolerance of the mounting jig.
- the device for testing the fingerprint chip of the embodiment of the present application can compensate the pressure difference caused by the surface condition of the fingerprint chip and the tolerance of the fixture by using a spring structure with a suitable elastic modulus, thereby making the whole-plate fingerprint chip
- the pressure of a single chip on the whole fingerprint chip can meet the test pressure accuracy, thereby improving the test accuracy.
- the physical damage of the fingerprint chip can be avoided, and the requirement for the accuracy of the jig can be reduced.
- the spring constant Kt of the spring 103 satisfies the following formula:
- F1 is the maximum pressure that the fingerprint chip can withstand when the test pressure accuracy is met
- F2 is the minimum pressure that the fingerprint chip can withstand when the test pressure accuracy is met. That is to say, when testing the fingerprint chip, if the actual pressure of the single fingerprint chip is less than F1 or greater than F2, the test result may be biased, which affects the test accuracy.
- D is the difference in stroke between the test head subjected to the minimum pressure and the test head subjected to the maximum pressure in contact with the fingerprint chip. The stroke difference is caused by the warpage of the fingerprint chip, the tolerance of the jig (for example, the test head, the test head jig), and the deformation of the jig after long-term use.
- the compression length of the spring refers to the length of the spring in the test head that is subjected to the maximum pressure that is compressed under the test accuracy requirements.
- the standard pressure of the fingerprint chip test is 90N
- the test pressure accuracy is ⁇ 10N
- F1 100N
- F2 80N
- the stroke difference between the spring in the test head subjected to the minimum pressure and the spring in the test head subjected to the maximum pressure is 2 mm due to the warpage of the structure and the chip itself
- the elastic coefficient Kt may be selected to be greater than or equal to 10000 N/
- the spring of m, and the compression length l of the spring is at most 1 cm.
- the first drive device 130 can be a hydraulic or pneumatic device.
- the first drive device 130 can be a cylinder. In this way, by using a hydraulic or pneumatically driven drive device instead of a conventional motor to push the test head out, it is possible to ensure that the pressure is within a certain range and to avoid damage to the fingerprint chip caused by excessive pressure.
- the device 100 may further include a second support portion 140 and a second driving device 150.
- the second drive 150 can also be a hydraulic or pneumatic device.
- the second drive 150 can be a cylinder similar to the first drive 130.
- the second driving device 150 performs the reference acquisition during the fingerprint chip test by driving the second support portion 140. Specifically, the first support portion 130 and the second support portion 140 are slidably connected. a second driving device 150 for applying pressure to the second supporting portion 140 such that the analog finger 101 in each test head contacts the fingerprint chip corresponding to the position of the test head, and the simulated finger in each test head The driving of the second support portion 140 is stopped when the 101 contacts the fingerprint chip corresponding to the position of the test head 110.
- the analog finger 101 of the first driving device 130 in each test head 110 corresponds to The first support portion 120 is driven when the fingerprint chip at the position where the test head 110 is in contact, so that the dummy finger 101 in each test head 110 applies pressure to the fingerprint chip corresponding to the position of the test head 110.
- the apparatus 100 may further include a controller 160 for controlling the first driving device 130 and the second driving device 150 to drive the first support portion 120 and the second support portion 140, respectively.
- FIG. 4 is a schematic block diagram of an apparatus 200 for testing a fingerprint chip in accordance with another embodiment of the present application.
- the cylinder 210 is a specific implementation of the first drive unit 130 shown in FIG. 1
- the cylinder 260 is a specific implementation of the second drive unit 150 shown in FIG.
- the first phase performs the benchmark acquisition, and the second phase starts the test procedure to collect the semaphore.
- the entire fingerprint chip 280 is moved to the corresponding position of the test head, and the cylinder 260 is activated.
- the cylinder 260 is pressurized, so that the entire fingerprint chip 280 to be tested is in contact with the test socket (SOCKET) for reference acquisition.
- the cylinder 210 pressurizes and drives the slider 220 connected to the first support portion 240 to move upward along the slide rail 230 relative to the second support portion 250, and ejects the test head 110, so that the entire fingerprint chip is The sensor on the 280 surface touches the analog finger.
- the test program is started, the semaphore is collected, and the test result is obtained by testing the internal operation of the program.
- the conventional method is to control the pressure by using the motor to control the stroke of the spring after the test head contacts the fingerprint chip, but this method has certain requirements for the mechanical structure and the fingerprint chip warpage, and the device needs to be calibrated to ensure each time. Power is safe and meets testing needs.
- the device for testing the fingerprint chip of the embodiment of the present application can change the thrust of the cylinder by changing the air pressure and the area of the cylinder by using a driving device in the form of a cylinder, thereby eliminating the need for calibration.
- the device embodiments of the present application are described in detail above with reference to FIG. 1 to FIG. 4 .
- the method embodiments of the present application are described in detail below with reference to FIG. 5 . It should be understood that the method embodiments correspond to the device embodiments, and similar descriptions may be referred to. Device embodiment.
- FIG. 5 shows a schematic flow chart of a method for testing a fingerprint chip according to an embodiment of the present application. It should be understood that the method illustrated in Figure 5 can utilize any of the device embodiments described above. As shown in FIG. 5, the method includes: S510, the first driving device drives the first supporting portion with a target pressure, the first pressure is equal to a standard pressure and a test head included in the at least one test head The product of the number.
- the first driving device 130 needs to act on the first support.
- the pressure of the portion 120 should be 36N, that is, the target pressure is 36N.
- S520 Determine a pressure parameter corresponding to the fingerprint chip at the location of each test head, where the pressure parameter is used to indicate the pressure of the fingerprint chip at the location of each test head.
- the pressure parameter may be a generated capacitance between the fingerprint chip and the corresponding analog finger.
- the pressure parameter corresponding to the fingerprint chip at the location of each test head it can be determined whether the fingerprint chip satisfies a so-called good chip or a bad chip under the test accuracy requirement.
- the method for testing a fingerprint chip in the embodiment of the present application can compensate for the pressure difference caused by the surface condition of the chip and the tolerance of the fixture by using a spring structure with a suitable elastic modulus, thereby making a single chip on the whole fingerprint chip
- the pressure can withstand the test pressure accuracy, which can improve the test accuracy.
- the physical damage of the fingerprint chip can be avoided, and the requirement for the accuracy of the jig can be reduced.
- the method may further include:
- the second driving device applies pressure to the second supporting portion with a second pressure, driving the analog finger in each test head to contact with a fingerprint chip corresponding to the position of the test head, and in each test head
- the analog finger stops driving the second support portion when it contacts the fingerprint chip corresponding to the position of the test head.
- the second pressure may be a pressure of any magnitude, and generally, the second pressure is less than the first pressure.
- the second drive means may be a hydraulic or pneumatic device.
- the pressure between the analog finger and the fingerprint chip can be guaranteed to be within a certain range, and the cumbersome procedure in which the motor mode needs to be calibrated can be avoided. It also reduces the requirement for structural accuracy.
- the size of the sequence numbers of the foregoing processes does not mean the order of execution sequence, and the order of execution of each process should be determined by its function and internal logic, and should not be applied to the embodiment of the present application.
- the implementation process constitutes any limitation.
- the disclosed systems, devices, and methods may be implemented in other manners.
- the device embodiments described above are merely illustrative.
- the division of the unit is only a logical function division.
- there may be another division manner for example, multiple units or components may be combined or Can be integrated into another system, or some features can be ignored or not executed.
- the mutual coupling or direct coupling or communication connection shown or discussed may be an indirect coupling or communication connection through some interface, device or unit, and may be in an electrical, mechanical or other form.
- the units described as separate components may or may not be physically separated, and the components displayed as units may or may not be physical units, that is, may be located in one place, or may be distributed to multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of the embodiment.
- each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit.
- the functions may be stored in a computer readable storage medium if implemented in the form of a software functional unit and sold or used as a separate fingerprint chip. Based on such understanding, the technical solution of the present application or the part contributing to the prior art or the part of the technical solution may be embodied in the form of a software fingerprint chip, which is stored in a storage medium. Including a number of instructions for causing a computer device (which may be a personal computer, server, or network device, etc.) to perform all or part of the methods described in various embodiments of the present application. Step by step.
- the foregoing storage medium includes: a U disk, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disk, and the like. .
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Abstract
Description
本申请涉及指纹芯片测试领域,尤其涉及一种用于测试指纹芯片的装置和方法。The present application relates to the field of fingerprint chip testing, and more particularly to an apparatus and method for testing a fingerprint chip.
随着指纹识别和移动支付浪潮的到来,电容式指纹芯片迎来了爆发增长,而在对电容式指纹芯片应用的过程中,为了得到良好的图像质量,指纹芯片必须经过测试,以判断指纹芯片是否良好。With the advent of fingerprint recognition and mobile payment, capacitive fingerprint chips are experiencing explosive growth. In the process of applying capacitive fingerprint chips, in order to obtain good image quality, fingerprint chips must be tested to determine fingerprint chips. Is it good?
指纹芯片量产时,考虑到效率问题,需要同时测试整板芯片上的多颗芯片。目前对于多颗芯片的指纹感应区同步测试时,模拟手指与多颗芯片的耦合方式有两种:分立式按压及整片导电胶同时接触多颗芯片。这两种方式均有其缺点:1、分立式按压,对于每个测试头的压力都需要分开进行调整,及对于IC的翘曲也会引起压力的变化;2、整片按压,基本无法控制整板IC各个位置的压力大小及整片导电橡胶的形变。最终,影响测试精度。When the fingerprint chip is mass-produced, in consideration of the efficiency problem, it is necessary to simultaneously test a plurality of chips on the entire chip. At present, when the fingerprint sensing area of a plurality of chips is synchronously tested, there are two ways of coupling the analog finger and the plurality of chips: the discrete pressing and the entire conductive adhesive simultaneously contact the plurality of chips. Both of these methods have their shortcomings: 1. Discrete pressing, the pressure of each test head needs to be adjusted separately, and the warpage of the IC will also cause pressure changes; 2. The whole piece of pressing is basically impossible. Control the pressure of each position of the whole board IC and the deformation of the whole piece of conductive rubber. Ultimately, it affects test accuracy.
发明内容Summary of the invention
本申请实施例提供一种用于测试指纹芯片的装置和方法,能够提高测试精度。Embodiments of the present application provide an apparatus and method for testing a fingerprint chip, which can improve test accuracy.
第一方面,提供了一种用于测试指纹芯片的装置,包括:至少一个测试头,每个测试头包括模拟手指,底座和弹簧,该弹簧连接在该模拟手指和该底座之间,用于缓冲第一支撑部对该模拟手指的作用力;In a first aspect, there is provided an apparatus for testing a fingerprint chip, comprising: at least one test head, each test head comprising a dummy finger, a base and a spring, the spring being coupled between the analog finger and the base for Buffering the force of the first support portion on the simulated finger;
该第一支撑部,该每个测试头中的底座与该第一支撑部连接;The first support portion, the base in each test head is connected to the first support portion;
第一驱动装置,用于驱动该第一支撑部,使得该每个测试头中的模拟手指向对应于该测试头所在位置的指纹芯片施加压力。The first driving device is configured to drive the first supporting portion such that the analog finger in each test head applies pressure to the fingerprint chip corresponding to the position of the test head.
本申请实施例的用于测试指纹芯片的装置,通过使用弹性系数合适的弹簧结构,能够补偿由于芯片表面情况及治具公差所引起的压力差,从而使得在进行整板指纹芯片的按压测试时,整板指纹芯片上的单颗芯片所承受的压力能够满足测试压力精度,进而能够提高测试精度。并且,能够避免指纹芯片的物理损坏,降低对治具精度的要求。The device for testing a fingerprint chip of the embodiment of the present application can compensate for the pressure difference caused by the surface condition of the chip and the tolerance of the fixture by using a spring structure with a suitable spring coefficient, so that when the whole board fingerprint chip is tested for pressing The pressure on a single chip on the whole board fingerprint chip can meet the test pressure accuracy, which can improve the test accuracy. Moreover, the physical damage of the fingerprint chip can be avoided, and the requirement for the accuracy of the jig can be reduced.
在一种可能的实现方式中,该第一驱动装置为液动或气动装置。 In a possible implementation, the first driving device is a hydraulic or pneumatic device.
通过采用液动或者气动驱动的装置,而非传统的电机将测试头顶出,使得模拟手指与指纹芯片接触时可保证压力在一定范围内,能够避免电机方式需要进行校准的繁琐程序,也能够降低对结构精度的要求。By using a hydraulic or pneumatically driven device instead of a conventional motor to push the test head out, the pressure between the analog finger and the fingerprint chip can be guaranteed to be within a certain range, which can avoid the cumbersome procedure of the motor mode that needs to be calibrated, and can also reduce Requirements for structural accuracy.
在一种可能的实现方式中,每个测试头中的弹簧的弹性系数于Kt满足以下公式:In a possible implementation, the spring constant of the spring in each test head satisfies the following formula at Kt:
其中,F1为在满足测试压力精度要求下该指纹芯片可承受的最大压力,F2为在满足测试压力精度要求下该指纹芯片可承受的最小压力,D为承受所述最小压力的测试头与承受所述最大压力的测试头与所述指纹芯片接触的行程差。Among them, F1 is the maximum pressure that the fingerprint chip can withstand when the test pressure accuracy is met, F2 is the minimum pressure that the fingerprint chip can withstand when the test pressure accuracy is met, and D is the test head and the bearing subjected to the minimum pressure. The stroke of the maximum pressure test head is in contact with the fingerprint chip.
在一种可能的实现方式中,弹簧的压缩长度l满足以下公式:In a possible implementation, the compression length l of the spring satisfies the following formula:
其中,所述弹簧的压缩长度l表示在满足测试精度要求下,承受的压力为F1的测试头中的弹簧被压缩的长度。Wherein, the compression length l of the spring indicates the length at which the spring in the test head subjected to the pressure F1 is compressed under the requirement of the test accuracy.
在一种可能的实现方式中,该装置还可以包括:In a possible implementation, the device may further include:
第二支撑部,该第一支撑部和该第二支撑部滑动连接;a second support portion, the first support portion and the second support portion are slidably connected;
第二驱动装置,用于向该第二支撑部施加压力,使得该每个测试头中的模拟手指与对应于该测试头所在位置的指纹芯片接触,并在该每个测试头中的模拟手指与对应于该测试头所在位置的指纹芯片接触时停止驱动该第二支撑部,其中该第一驱动装置在该每个测试头中的模拟手指与对应于该测试头所在位置的指纹芯片接触时驱动该第一支撑部,使得该每个测试头中的模拟手指向对应于该测试头所在位置的指纹芯片施加压力。a second driving device, configured to apply pressure to the second supporting portion, such that the simulated finger in each test head contacts the fingerprint chip corresponding to the position of the test head, and the simulated finger in each test head Stopping driving the second support portion when contacting the fingerprint chip corresponding to the position of the test head, wherein the first driving device contacts the dummy chip in each test head when contacting the fingerprint chip corresponding to the position of the test head The first support portion is driven such that the analog finger in each test head applies pressure to the fingerprint chip corresponding to the position of the test head.
在一种可能的实现方式中,该第二驱动装置为液动或气动装置。In a possible implementation, the second drive device is a hydraulic or pneumatic device.
在一种可能的实现方式中,该第一驱动装置为气缸。In a possible implementation, the first driving device is a cylinder.
在一种可能的实现方式中,该装置还可以包括:In a possible implementation, the device may further include:
控制器,用于控制该第一驱动装置和该第二驱动装置分别驱动该第一支撑部和该第二支撑部。And a controller for controlling the first driving device and the second driving device to drive the first supporting portion and the second supporting portion, respectively.
在一种可能的实现方式中,第二驱动装置为气缸。In a possible implementation, the second drive device is a cylinder.
第二方面,提供了一种测试指纹芯片的方法,该方法可以应用于第一方面或第一方面的任一可能实现的装置,该方法包括:该第一驱动装置以目标 压力驱动该第一支撑部,该第一压力等于标准压力与该至少一个测试头所包括的测试头的数量的乘积;In a second aspect, a method of testing a fingerprint chip is provided, the method being applicable to any of the possible implementations of the first aspect or the first aspect, the method comprising: the first driving device targeting Pressing the first support portion, the first pressure being equal to a product of a standard pressure and a number of test heads included in the at least one test head;
确定与该每个测试头所在位置的指纹芯片对应的压力参数,该压力参数用于表示该每个测试头所在位置的指纹芯片所承受的压力大小。Determining a pressure parameter corresponding to the fingerprint chip at the location of each test head, the pressure parameter being used to indicate the amount of pressure experienced by the fingerprint chip at the location of each test head.
本申请实施例的用于测试指纹芯片的方法,通过使用弹性系数合适的弹簧结构,能够补偿由于芯片表面情况及治具公差所引起的压力差,从而使得整板指纹芯片上的单颗芯片所承受的压力能够满足测试压力精度,进而能够提高测试精度。并且,能够避免指纹芯片的物理损坏,降低对治具精度的要求。The method for testing a fingerprint chip in the embodiment of the present application can compensate for the pressure difference caused by the surface condition of the chip and the tolerance of the fixture by using a spring structure with a suitable elastic modulus, thereby making a single chip on the whole fingerprint chip The pressure can withstand the test pressure accuracy, which can improve the test accuracy. Moreover, the physical damage of the fingerprint chip can be avoided, and the requirement for the accuracy of the jig can be reduced.
在一种可能的实现方式中,该第一驱动装置为液动或气动装置。In a possible implementation, the first driving device is a hydraulic or pneumatic device.
在一种可能的实现方式中,该每个测试头中的弹簧的弹性系数于Kt满足以下公式:In a possible implementation, the spring coefficient of the spring in each test head satisfies the following formula at Kt:
其中,F1为在满足测试压力精度要求下该指纹芯片可承受的最大压力,F2为在满足测试压力精度要求下该指纹芯片可承受的最小压力,D为承受该最小压力的测试头与承受该最大压力的测试头与该指纹芯片接触的行程差。Among them, F1 is the maximum pressure that the fingerprint chip can withstand when the test pressure accuracy is met, F2 is the minimum pressure that the fingerprint chip can withstand when the test pressure accuracy is met, and D is the test head that bears the minimum pressure and withstands the test. The stroke of the maximum pressure test head is in contact with the fingerprint chip.
在一种可能的实现方式中,弹簧的压缩长度l满足以下公式:In a possible implementation, the compression length l of the spring satisfies the following formula:
其中,所述弹簧的压缩长度l表示在满足测试精度要求下,承受的压力为F1的测试头中的弹簧被压缩的长度。Wherein, the compression length l of the spring indicates the length at which the spring in the test head subjected to the pressure F1 is compressed under the requirement of the test accuracy.
在一种可能的实现方式中,该方法还可以包括:该第二驱动装置以第二压力向该第二支撑部施加压力,驱动该每个测试头中的模拟手指与对应于该测试头所在位置的指纹芯片接触,并在该每个测试头中的模拟手指与对应于该测试头所在位置的指纹芯片接触时停止驱动该第二支撑部。In a possible implementation manner, the method may further include: applying, by the second driving device, pressure to the second support portion by using a second pressure to drive the analog finger in each test head and corresponding to the test head The fingerprint chip of the position contacts, and stops driving the second support portion when the dummy finger in each test head comes into contact with the fingerprint chip corresponding to the position of the test head.
在一种可能的实现方式中,该第二驱动装置为液动或气动装置。In a possible implementation, the second drive device is a hydraulic or pneumatic device.
通过采用液动或者气动驱动的第二驱动装置,而非传统的电机将测试头顶出,使得模拟手指与指纹芯片接触时可保证压力在一定范围内,能够避免电机方式需要进行校准的繁琐程序,也能够降低对结构精度的要求。By using a hydraulic or pneumatically driven second drive device instead of a conventional motor to push the test head out, the pressure between the analog finger and the fingerprint chip can be guaranteed to be within a certain range, and the cumbersome procedure in which the motor mode needs to be calibrated can be avoided. It also reduces the requirement for structural accuracy.
图1是根据本申请一个实施例的用于测试指纹芯片的装置的示意性框图。1 is a schematic block diagram of an apparatus for testing a fingerprint chip in accordance with one embodiment of the present application.
图2是被测芯片受力示意图。Figure 2 is a schematic diagram of the force of the chip under test.
图3是被测芯片受力另一示意图。Figure 3 is another schematic diagram of the force of the chip under test.
图4是根据本申请另一实施例的用于测试指纹芯片的装置的示意性框图。4 is a schematic block diagram of an apparatus for testing a fingerprint chip in accordance with another embodiment of the present application.
图5是根据本申请实施例的用于测试指纹芯片的方法的示意性流程图。FIG. 5 is a schematic flow chart of a method for testing a fingerprint chip according to an embodiment of the present application.
下面将结合本申请实施例中的附图,对本申请实施例中的技术方案进行描述。The technical solutions in the embodiments of the present application will be described below with reference to the accompanying drawings in the embodiments of the present application.
图1是本申请实施例的用于测试指纹芯片的装置100的一个示意性框图。应理解,图1示出的用于测试指纹芯片的装置仅是示例,本申请实施例的用于测试指纹芯片的装置还可包括其他模块或单元,或者包括与图1中的各个模块的功能相似的模块,或者并非要包括图1中的所有模块。FIG. 1 is a schematic block diagram of an
装置100包括至少一个测试头110,第一支撑部120和第一驱动装置130。The
每个测试头包括模拟手指101,底座102和弹簧103。弹簧103连接在模拟手指101和底座102之间,用于缓冲第一支撑部120对模拟手指101的作用力。每个测试头中的底座102与第一支撑部120连接。Each test head includes a
在对指纹芯片进行测试时,第一驱动装置130驱动第一支撑部120,使得所述每个测试头中的模拟手指101向对应于该测试头所在位置的指纹芯片施加压力。When testing the fingerprint chip, the
应理解,测试头110可拆卸,在使用时,可将测试头110安装于测试头夹具中(图中未示出),并与第一支撑部120连接。第一支撑部120可以是测试头夹具的一部分,也可以是单独的部件。在对指纹芯片进行测试时,第一驱动装置130通过驱动第一支撑部120,将测试头110从测试头夹具中顶出,模拟手指模拟人手按压指纹芯片。It should be understood that the
还应理解,图1中示出的四个测试头仅为示意性说明,装置100根据实际需要可以包括更多或更少的测试头。It should also be understood that the four test heads shown in FIG. 1 are merely illustrative and that the
指纹芯片生产封装由于是条状出货,因而指纹芯片封装完成后的冷却引起的翘曲是无法完全避免的,翘曲会使得指纹芯片各个位置的高度不一致, 即单颗指纹芯片的高度不一致。此外,由于模拟手指的生产及安装夹具都会存在一定的公差,一般机械加工可保证在±0.01毫米(mm)内,但由于夹具是多个部件组成公差会累积,及橡胶由于材料问题公差也是很难保证的,因而可能存在倾斜及高低不平的可能性。这两方面的因素,均会导致测试压力不一致的问题,从而影响测试精度,将坏的指纹芯片误认为是好的指纹芯片或者将好的指纹芯片误认为是坏的指纹芯片Since the fingerprint chip production package is strip-shaped, the warpage caused by the cooling after the completion of the fingerprint chip package cannot be completely avoided, and the warpage may make the heights of the fingerprint chips inconsistent at various positions. That is, the height of a single fingerprint chip is inconsistent. In addition, due to the tolerances of the production and installation of the simulated fingers, the general machining can be guaranteed within ±0.01 mm (mm), but the tolerances of the components due to the multiple components of the fixture will accumulate, and the tolerance of the rubber due to material problems is also very It is difficult to guarantee, so there may be the possibility of tilt and unevenness. These two factors will lead to inconsistent test pressure, which will affect the test accuracy, mistake the bad fingerprint chip for a good fingerprint chip or mistake the good fingerprint chip for a bad fingerprint chip.
假定需要测试指纹芯片压力为9牛(N)时的数据,即标准压力为9N,测试压力精度为±2N,由于图1中有4颗指纹芯片,因此,第一驱动装置130作用于第一支撑部120的压力应为36N。Suppose that it is necessary to test the data when the fingerprint chip pressure is 9 N (N), that is, the standard pressure is 9N, and the test pressure accuracy is ±2N. Since there are 4 fingerprint chips in FIG. 1, the
由于整板芯片的翘曲,如图2中的(a)所示,从左至右四个测试头分别对应的四颗指纹芯片所承受的压力分别是13N、7N、3N、1.7N。再如图2中的(b)所示,从左至右四个测试头分别对应的四颗芯片所承受的压力分别是15N、5N、5N、15N。可见,芯片的翘曲导致测试的压力差异较大。而通过弹簧补偿后,如图2中的(c)所示,从左至右四个测试头分别对应的四颗指纹芯片所承受的压力分别是9N、11N、11N、9N。因此,通过采用弹簧能够补偿芯片的翘曲所引起的压力差。Due to the warpage of the whole chip, as shown in (a) of FIG. 2, the pressures of the four fingerprint chips corresponding to the four test heads from left to right are 13N, 7N, 3N, and 1.7N, respectively. Further, as shown in (b) of FIG. 2, the pressures of the four chips corresponding to the four test heads from left to right are 15N, 5N, 5N, and 15N, respectively. It can be seen that the warpage of the chip causes a large difference in the pressure of the test. After being compensated by the spring, as shown in (c) of FIG. 2, the pressures of the four fingerprint chips corresponding to the four test heads from left to right are 9N, 11N, 11N, and 9N, respectively. Therefore, the pressure difference caused by the warpage of the chip can be compensated by using a spring.
如图3中的(a)所示,由于夹具造成芯片的倾斜,从左至右四个测试头分别对应的四颗指纹芯片所承受的压力分别是3N、7N、13N、17N。由于测试头高度不一致,如图3中的(b)所示,从左至右四个测试头分别对应的四颗指纹芯片所承受的压力分别是15N、5N、15N、5N。可见,测试头的生产及安装夹具的公差导致测试的压力差异较大。而通过弹簧补偿后,如图3中的(c)所示,从左至右四个测试头分别对应的四颗指纹芯片所承受的压力分别是11N、9N、9N、11N。因此,通过采用弹簧能够补偿测试头的生产及安装夹具的公差所引起的压力差。As shown in (a) of FIG. 3, due to the tilt of the chip caused by the jig, the pressures of the four fingerprint chips corresponding to the four test heads from left to right are 3N, 7N, 13N, and 17N, respectively. Since the heights of the test heads are inconsistent, as shown in (b) of FIG. 3, the pressures of the four fingerprint chips corresponding to the four test heads from left to right are 15N, 5N, 15N, and 5N, respectively. It can be seen that the tolerances of the test head production and installation fixtures lead to a large difference in test pressure. After being compensated by the spring, as shown in (c) of FIG. 3, the pressures of the four fingerprint chips corresponding to the four test heads from left to right are 11N, 9N, 9N, and 11N, respectively. Therefore, by using a spring, it is possible to compensate for the pressure difference caused by the production of the test head and the tolerance of the mounting jig.
因此,本申请实施例的用于测试指纹芯片的装置,通过使用弹性系数合适的弹簧结构,能够补偿由于指纹芯片表面情况及治具公差所引起的压力差,从而使得在进行整板指纹芯片的按压测试时,整板指纹芯片上的单颗芯片所承受的压力能够满足测试压力精度,进而能够提高测试精度。并且,能够避免指纹芯片的物理损坏,降低对治具精度的要求。Therefore, the device for testing the fingerprint chip of the embodiment of the present application can compensate the pressure difference caused by the surface condition of the fingerprint chip and the tolerance of the fixture by using a spring structure with a suitable elastic modulus, thereby making the whole-plate fingerprint chip When the test is pressed, the pressure of a single chip on the whole fingerprint chip can meet the test pressure accuracy, thereby improving the test accuracy. Moreover, the physical damage of the fingerprint chip can be avoided, and the requirement for the accuracy of the jig can be reduced.
可选地,在本申请实施例中,弹簧103的弹性系数Kt满足以下公式:Optionally, in the embodiment of the present application, the spring constant Kt of the spring 103 satisfies the following formula:
其中,F1为在满足测试压力精度要求下所述指纹芯片可承受的最大压力,F2为在满足测试压力精度要求下所述指纹芯片可承受的最小压力。也就是说,在测试指纹芯片时,如果单颗指纹芯片实际所承受的压力小于F1,或者大于F2,则测试的结果可能会有偏差,影响测试精度。D为承受所述最小压力的测试头与承受所述最大压力的测试头与所述指纹芯片接触的行程差。该行程差是由指纹芯片翘曲、治具(例如,测试头、测试头夹具)公差、治具在长期使用后的形变等造成的。Wherein F1 is the maximum pressure that the fingerprint chip can withstand when the test pressure accuracy is met, and F2 is the minimum pressure that the fingerprint chip can withstand when the test pressure accuracy is met. That is to say, when testing the fingerprint chip, if the actual pressure of the single fingerprint chip is less than F1 or greater than F2, the test result may be biased, which affects the test accuracy. D is the difference in stroke between the test head subjected to the minimum pressure and the test head subjected to the maximum pressure in contact with the fingerprint chip. The stroke difference is caused by the warpage of the fingerprint chip, the tolerance of the jig (for example, the test head, the test head jig), and the deformation of the jig after long-term use.
通过选择符合公式(1)的弹性系数的弹簧,可实现对各颗指纹芯片在模拟手指按压下的正常测试,避免指纹芯片的损坏。By selecting a spring that conforms to the elastic coefficient of formula (1), normal testing of each fingerprint chip under simulated finger pressing can be achieved to avoid damage of the fingerprint chip.
此外,弹簧的压缩长度l满足以下公式:In addition, the compression length l of the spring satisfies the following formula:
应理解,弹簧的压缩长度是指在满足测试精度要求下,承受最大压力的测试头中的弹簧被压缩的长度。It should be understood that the compression length of the spring refers to the length of the spring in the test head that is subjected to the maximum pressure that is compressed under the test accuracy requirements.
举例来说,指纹芯片测试时的标准压力为90N,测试压力精度为±10N,则F1=100N,F2=80N。预计由于结构及芯片本身的翘曲造成承受所述最小压力的测试头中的弹簧与承受所述最大压力的测试头中的弹簧的行程差为2mm,则可以选择弹性系数Kt大于或等于10000N/m的弹簧,而弹簧压缩长度l最大为1cm。For example, the standard pressure of the fingerprint chip test is 90N, the test pressure accuracy is ±10N, then F1=100N, F2=80N. It is expected that the stroke difference between the spring in the test head subjected to the minimum pressure and the spring in the test head subjected to the maximum pressure is 2 mm due to the warpage of the structure and the chip itself, and the elastic coefficient Kt may be selected to be greater than or equal to 10000 N/ The spring of m, and the compression length l of the spring is at most 1 cm.
可选地,该第一驱动装置130可以是液动或者气动装置。比如,第一驱动装置130可以是气缸。这样,通过采用液动或者气动驱动的驱动装置,而非传统的电机将测试头顶出,可保证压力在一定范围内,避免压力过大对指纹芯片造成损坏。Alternatively, the
可选地,装置100还可以包括第二支撑部140和第二驱动装置150。第二驱动装置150也可以是液动或者气动装置。比如,第二驱动装置150可以是类似于第一驱动装置130的气缸。Optionally, the
第二驱动装置150通过驱动第二支撑部140,进行指纹芯片测试时的基准采集。具体地,第一支撑部130和第二支撑部140滑动连接。第二驱动装置150,用于向第二支撑部140施加压力,使得每个测试头中的模拟手指101与对应于该测试头所在位置的指纹芯片接触,并在每个测试头中的模拟手指101与对应于该测试头110所在位置的指纹芯片接触时停止驱动第二支撑部140。其中,第一驱动装置130在每个测试头110中的模拟手指101与对应
于该测试头110所在位置的指纹芯片接触时驱动第一支撑部120,使得每个测试头110中的模拟手指101向对应于该测试头110所在位置的指纹芯片施加压力。The
可选地,该装置100还可以包括控制器160,用于控制第一驱动装置130和第二驱动装置150分别驱动第一支撑部120和第二支撑部140。Optionally, the
图4是本申请另一实施例的用于测试指纹芯片的装置200的示意性框图。图4中,气缸210是图1所示的第一驱动装置130的一种具体实现方式,气缸260是图1所示的第二驱动装置150的一种具体实现方式。4 is a schematic block diagram of an
在对指纹芯片进行测试时,分为两个阶段,第一阶段进行基准采集,第二阶段启动测试程序,对信号量进行采集。When testing the fingerprint chip, it is divided into two phases. The first phase performs the benchmark acquisition, and the second phase starts the test procedure to collect the semaphore.
在进行第一阶段时,将整条指纹芯片280移动到测试头对应位置,启动气缸260。气缸260加压,使得被测整条指纹芯片280与测试座(SOCKET)接触上,进行基准采集。When the first stage is performed, the
在进行第二阶段测试时,气缸210加压驱动连接第一支撑部240的滑块220沿着滑轨230相对第二支撑部250向上运动,顶出测试头110,使得被整条测指纹芯片280表面的传感器接触到模拟手指。同时,启动测试程序,对信号量进行采集,通过测试程序内部运算,得到测试结果。During the second-stage test, the
常规的方式为利用电机控制测试头与指纹芯片接触后对弹簧的行程,从而控制压力,但此方式对于机械结构及指纹芯片翘曲会有一定的要求,并且设备需要校准,才可保证每次力量是安全并可满足测试需求的。而本申请实施例的用于测试指纹芯片的装置通过采用气缸形式的驱动装置,可通过改变气缸的气压与面积即可改变气缸的推力,从而不需要进行校准。并且,改变指纹芯片型号时也不需要对设备进行校准,如果改变同时测试的芯片数量,只需要改变气压即可让压力变化。The conventional method is to control the pressure by using the motor to control the stroke of the spring after the test head contacts the fingerprint chip, but this method has certain requirements for the mechanical structure and the fingerprint chip warpage, and the device needs to be calibrated to ensure each time. Power is safe and meets testing needs. However, the device for testing the fingerprint chip of the embodiment of the present application can change the thrust of the cylinder by changing the air pressure and the area of the cylinder by using a driving device in the form of a cylinder, thereby eliminating the need for calibration. Moreover, there is no need to calibrate the device when changing the fingerprint chip model. If you change the number of chips tested at the same time, you only need to change the air pressure to change the pressure.
上文结合图1至图4,详细描述了本申请的装置实施例,下文结合图5详细描述本申请的方法实施例,应理解,方法实施例与装置实施例相互对应,类似的描述可以参照装置实施例。The device embodiments of the present application are described in detail above with reference to FIG. 1 to FIG. 4 . The method embodiments of the present application are described in detail below with reference to FIG. 5 . It should be understood that the method embodiments correspond to the device embodiments, and similar descriptions may be referred to. Device embodiment.
图5示出了根据本申请实施例的用于测试指纹芯片的方法的示意性流程图。应理解,图5所示的方法可以应用上文中所介绍的装置实施例中的任一装置。如图5所示,该方法包括:S510,该第一驱动装置以目标压力驱动该第一支撑部,该第一压力等于标准压力与该至少一个测试头所包括的测试头 的数量的乘积。FIG. 5 shows a schematic flow chart of a method for testing a fingerprint chip according to an embodiment of the present application. It should be understood that the method illustrated in Figure 5 can utilize any of the device embodiments described above. As shown in FIG. 5, the method includes: S510, the first driving device drives the first supporting portion with a target pressure, the first pressure is equal to a standard pressure and a test head included in the at least one test head The product of the number.
例如,以图1所示的当前需要测试的指纹芯片为4颗为例,假设需要测试指纹芯片压力为9N时的数据,即标准压力为9N,则第一驱动装置130需要作用于第一支撑部120的压力应为36N,即目标压力为36N。For example, taking the fingerprint chip currently required to be tested as shown in FIG. 1 as an example, if it is necessary to test the data when the fingerprint chip pressure is 9N, that is, the standard pressure is 9N, the
S520,确定与该每个测试头所在位置的指纹芯片对应的压力参数,该压力参数用于表示该每个测试头所在位置的指纹芯片所承受的压力大小。S520. Determine a pressure parameter corresponding to the fingerprint chip at the location of each test head, where the pressure parameter is used to indicate the pressure of the fingerprint chip at the location of each test head.
可选地,该压力参数可以是指纹芯片与对应的模拟手指之间的产生的电容大小。Optionally, the pressure parameter may be a generated capacitance between the fingerprint chip and the corresponding analog finger.
通过确定与该每个测试头所在位置的指纹芯片对应的压力参数,可以确定该指纹芯片是否满足测试精度要求下所谓的好的芯片或坏的芯片。By determining the pressure parameter corresponding to the fingerprint chip at the location of each test head, it can be determined whether the fingerprint chip satisfies a so-called good chip or a bad chip under the test accuracy requirement.
本申请实施例的用于测试指纹芯片的方法,通过使用弹性系数合适的弹簧结构,能够补偿由于芯片表面情况及治具公差所引起的压力差,从而使得整板指纹芯片上的单颗芯片所承受的压力能够满足测试压力精度,进而能够提高测试精度。并且,能够避免指纹芯片的物理损坏,降低对治具精度的要求。The method for testing a fingerprint chip in the embodiment of the present application can compensate for the pressure difference caused by the surface condition of the chip and the tolerance of the fixture by using a spring structure with a suitable elastic modulus, thereby making a single chip on the whole fingerprint chip The pressure can withstand the test pressure accuracy, which can improve the test accuracy. Moreover, the physical damage of the fingerprint chip can be avoided, and the requirement for the accuracy of the jig can be reduced.
可选地,在该第一驱动装置以目标压力驱动该第一支撑部之前,该方法还可以包括:Optionally, before the first driving device drives the first supporting portion with a target pressure, the method may further include:
该第二驱动装置以第二压力向该第二支撑部施加压力,驱动该每个测试头中的模拟手指与对应于该测试头所在位置的指纹芯片接触,并在该每个测试头中的模拟手指与对应于该测试头所在位置的指纹芯片接触时停止驱动该第二支撑部。The second driving device applies pressure to the second supporting portion with a second pressure, driving the analog finger in each test head to contact with a fingerprint chip corresponding to the position of the test head, and in each test head The analog finger stops driving the second support portion when it contacts the fingerprint chip corresponding to the position of the test head.
应理解,第二压力可以是任意大小的压力,一般地,第二压力小于第一压力。It should be understood that the second pressure may be a pressure of any magnitude, and generally, the second pressure is less than the first pressure.
可选地,第二驱动装置可以是液动或气动装置。Alternatively, the second drive means may be a hydraulic or pneumatic device.
通过采用液动或者气动驱动的第二驱动装置,而非传统的电机将测试头顶出,使得模拟手指与指纹芯片接触时可保证压力在一定范围内,能够避免电机方式需要进行校准的繁琐程序,也能够降低对结构精度的要求。By using a hydraulic or pneumatically driven second drive device instead of a conventional motor to push the test head out, the pressure between the analog finger and the fingerprint chip can be guaranteed to be within a certain range, and the cumbersome procedure in which the motor mode needs to be calibrated can be avoided. It also reduces the requirement for structural accuracy.
应理解,本文中术语“和/或”,仅仅是一种描述关联对象的关联关系,表示可以存在三种关系,例如,A和/或B,可以表示:单独存在A,同时存在A和B,单独存在B这三种情况。另外,本文中字符“/”,一般表示前后关联对象是一种“或”的关系。 It should be understood that the term "and/or" herein is merely an association relationship describing an associated object, indicating that there may be three relationships, for example, A and/or B, which may indicate that A exists separately, and A and B exist simultaneously. There are three cases of B alone. In addition, the character "/" in this article generally indicates that the contextual object is an "or" relationship.
应理解,在本申请的各种实施例中,上述各过程的序号的大小并不意味着执行顺序的先后,各过程的执行顺序应以其功能和内在逻辑确定,而不应对本申请实施例的实施过程构成任何限定。It should be understood that, in the various embodiments of the present application, the size of the sequence numbers of the foregoing processes does not mean the order of execution sequence, and the order of execution of each process should be determined by its function and internal logic, and should not be applied to the embodiment of the present application. The implementation process constitutes any limitation.
本领域普通技术人员可以意识到,结合本文中所公开的实施例描述的各示例的单元及算法步骤,能够以电子硬件、或者计算机软件和电子硬件的结合来实现。这些功能究竟以硬件还是软件方式来执行,取决于技术方案的特定应用和设计约束条件。专业技术人员可以对每个特定的应用来使用不同方法来实现所描述的功能,但是这种实现不应认为超出本申请的范围。Those of ordinary skill in the art will appreciate that the elements and algorithm steps of the various examples described in connection with the embodiments disclosed herein can be implemented in electronic hardware or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the solution. A person skilled in the art can use different methods to implement the described functions for each particular application, but such implementation should not be considered to be beyond the scope of the present application.
所属领域的技术人员可以清楚地了解到,为描述的方便和简洁,上述描述的系统、装置和单元的具体工作过程,可以参考前述方法实施例中的对应过程,在此不再赘述。A person skilled in the art can clearly understand that for the convenience and brevity of the description, the specific working process of the system, the device and the unit described above can refer to the corresponding process in the foregoing method embodiment, and details are not described herein again.
在本申请所提供的几个实施例中,应该理解到,所揭露的系统、装置和方法,可以通过其它的方式实现。例如,以上所描述的装置实施例仅仅是示意性的,例如,所述单元的划分,仅仅为一种逻辑功能划分,实际实现时可以有另外的划分方式,例如多个单元或组件可以结合或者可以集成到另一个系统,或一些特征可以忽略,或不执行。另一点,所显示或讨论的相互之间的耦合或直接耦合或通信连接可以是通过一些接口,装置或单元的间接耦合或通信连接,可以是电性,机械或其它的形式。In the several embodiments provided by the present application, it should be understood that the disclosed systems, devices, and methods may be implemented in other manners. For example, the device embodiments described above are merely illustrative. For example, the division of the unit is only a logical function division. In actual implementation, there may be another division manner, for example, multiple units or components may be combined or Can be integrated into another system, or some features can be ignored or not executed. In addition, the mutual coupling or direct coupling or communication connection shown or discussed may be an indirect coupling or communication connection through some interface, device or unit, and may be in an electrical, mechanical or other form.
所述作为分离部件说明的单元可以是或者也可以不是物理上分开的,作为单元显示的部件可以是或者也可以不是物理单元,即可以位于一个地方,或者也可以分布到多个网络单元上。可以根据实际的需要选择其中的部分或者全部单元来实现本实施例方案的目的。The units described as separate components may or may not be physically separated, and the components displayed as units may or may not be physical units, that is, may be located in one place, or may be distributed to multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of the embodiment.
另外,在本申请各个实施例中的各功能单元可以集成在一个处理单元中,也可以是各个单元单独物理存在,也可以两个或两个以上单元集成在一个单元中。In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit.
所述功能如果以软件功能单元的形式实现并作为独立的指纹芯片销售或使用时,可以存储在一个计算机可读取存储介质中。基于这样的理解,本申请的技术方案本质上或者说对现有技术做出贡献的部分或者该技术方案的部分可以以软件指纹芯片的形式体现出来,该计算机软件指纹芯片存储在一个存储介质中,包括若干指令用以使得一台计算机设备(可以是个人计算机,服务器,或者网络设备等)执行本申请各个实施例所述方法的全部或部 分步骤。而前述的存储介质包括:U盘、移动硬盘、只读存储器(ROM,Read-Only Memory)、随机存取存储器(RAM,Random Access Memory)、磁碟或者光盘等各种可以存储程序代码的介质。The functions may be stored in a computer readable storage medium if implemented in the form of a software functional unit and sold or used as a separate fingerprint chip. Based on such understanding, the technical solution of the present application or the part contributing to the prior art or the part of the technical solution may be embodied in the form of a software fingerprint chip, which is stored in a storage medium. Including a number of instructions for causing a computer device (which may be a personal computer, server, or network device, etc.) to perform all or part of the methods described in various embodiments of the present application. Step by step. The foregoing storage medium includes: a U disk, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disk, and the like. .
以上所述,仅为本申请的具体实施方式,但本申请的保护范围并不局限于此,任何熟悉本技术领域的技术人员在本申请揭露的技术范围内,可轻易想到变化或替换,都应涵盖在本申请的保护范围之内。因此,本申请的保护范围应以所述权利要求的保护范围为准。 The foregoing is only a specific embodiment of the present application, but the scope of protection of the present application is not limited thereto, and any person skilled in the art can easily think of changes or substitutions within the technical scope disclosed in the present application. It should be covered by the scope of protection of this application. Therefore, the scope of protection of the present application should be determined by the scope of the claims.
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| PCT/CN2017/074198 WO2018152662A1 (en) | 2017-02-21 | 2017-02-21 | Device and method for testing fingerprint sensor |
| CN201780000087.4A CN107003351B (en) | 2017-02-21 | 2017-02-21 | Apparatus and method for testing fingerprint chip |
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| PCT/CN2017/074198 WO2018152662A1 (en) | 2017-02-21 | 2017-02-21 | Device and method for testing fingerprint sensor |
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| CN111985337A (en) * | 2020-07-21 | 2020-11-24 | 江苏艾科半导体有限公司 | Fingerprint identification chip testing method for improving detection efficiency and accuracy |
| CN114323593B (en) * | 2021-12-31 | 2024-03-15 | 深圳市汇顶科技股份有限公司 | Testing method and testing device of fingerprint detection device |
| CN115825702B (en) * | 2023-02-06 | 2023-04-28 | 镇江矽佳测试技术有限公司 | Fingerprint chip anti-interference testing device |
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