WO2006008973A1 - コンデンサ - Google Patents
コンデンサ Download PDFInfo
- Publication number
- WO2006008973A1 WO2006008973A1 PCT/JP2005/012553 JP2005012553W WO2006008973A1 WO 2006008973 A1 WO2006008973 A1 WO 2006008973A1 JP 2005012553 W JP2005012553 W JP 2005012553W WO 2006008973 A1 WO2006008973 A1 WO 2006008973A1
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- WO
- WIPO (PCT)
- Prior art keywords
- electrode
- capacitor
- capacitor element
- capacitor according
- terminal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
- H01G9/004—Details
- H01G9/04—Electrodes or formation of dielectric layers thereon
- H01G9/042—Electrodes or formation of dielectric layers thereon characterised by the material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
- H01G9/004—Details
- H01G9/008—Terminals
- H01G9/012—Terminals specially adapted for solid capacitors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
- H01G9/004—Details
- H01G9/04—Electrodes or formation of dielectric layers thereon
- H01G9/048—Electrodes or formation of dielectric layers thereon characterised by their structure
Definitions
- the present invention relates to a capacitor excellent in high frequency characteristics.
- a conventional capacitor excellent in high frequency characteristics is disclosed, for example, in Japanese Patent Application Laid-Open No. 2002-299152. Positive and negative electrode terminals are alternately arranged at both ends of this ceramic capacitor. This reduces ESL. Furthermore, a multilayer ceramic capacitor is also known in which ESL is reduced by reducing the inductance by arranging the respective electrode terminals alternately in a matrix. Such a capacitor is disclosed, for example, in Japanese Patent Laid-Open No. 2001-189234. In these capacitors, the electrode structure is designed to cancel the magnetic field induced by the current flowing in the capacitor. In addition, the current path length of the electrode is shortened. These synergetic effects have realized low ESL.
- the capacitor of the present invention has a first capacitor element and a second capacitor element laminated to the first capacitor element.
- the first capacitor element is a valve metal sheet and It has a current collector film, a solid electrolyte layer, a current collector layer, and a first through hole electrode.
- a porous layer is provided on one side of the valve metal sheet, and a dielectric film is formed on the porous layer.
- the solid electrolyte layer is formed on the dielectric film, and the current collector layer is formed on the solid electrolyte layer.
- the first through hole electrode is conducted to the current collector layer, insulated from the valve metal sheet body, and penetrates the valve metal sheet body.
- the second capacitor element has a dielectric layer, a first electrode, a second electrode, a plurality of second through hole electrodes, and a plurality of extraction portions of the second electrode.
- the first electrode and the second electrode are insulated from each other through the dielectric layer, the first electrode is electrically connected to the first through-hole electrode, and the second electrode is electrically connected to the valve metal sheet It is connected.
- a second through hole electrode is provided through the dielectric layer, connected to the first electrode, and insulated from the second electrode.
- the lead-out portion of the second electrode also exhibits the dielectric layer force.
- the second through hole electrode and the takeout portion are alternately arranged.
- FIG. 1 is an external perspective view of a capacitor according to a first embodiment of the present invention.
- FIG. 2A is a cross-sectional view of the capacitor shown in FIG.
- FIG. 2B is an enlarged view of an essential part of the capacitor shown in FIG.
- FIG. 2C is a partial enlarged view showing the upper surface portion of another capacitor according to Embodiment 1 of the present invention.
- FIG. 3A is another cross-sectional structural view of the capacitor in accordance with the first exemplary embodiment of the present invention.
- FIG. 3B is still another cross-sectional structural view of the capacitor in accordance with the first exemplary embodiment of the present invention.
- FIG. 4 is a cross-sectional process diagram for illustrating a method of manufacturing the first capacitor element of the capacitor in the first embodiment of the present invention.
- FIG. 5 is a cross-sectional process diagram for illustrating the method of manufacturing the first capacitor element, following FIG. 4.
- FIG. 6 is a cross-sectional process diagram for illustrating the method of manufacturing the first capacitor element, following FIG. 5.
- FIG. 7 is a cross-sectional process diagram for illustrating the method of manufacturing the first capacitor element, following FIG.
- FIG. 8 is a cross-sectional process diagram for illustrating the method of manufacturing the second capacitor element of the capacitor in the first embodiment of the present invention.
- FIG. 9 is a cross-sectional process diagram for illustrating the method of manufacturing the second capacitor element, following FIG. 8.
- FIG. 10 is a sectional view for explaining the method of manufacturing the second capacitor element, following FIG. 9.
- FIG. 11 is a sectional process drawing for explaining the manufacturing method of the second capacitor element continued from FIG.
- FIG. 12 is a sectional process drawing for explaining the manufacturing method of the second capacitor element continued from FIG.
- FIG. 13 is a sectional process drawing for explaining the manufacturing method of the second capacitor element continued from FIG. 12.
- FIG. 14 is a cross-sectional view of the capacitor in the second embodiment of the present invention. Explanation of sign
- FIG. 1 is an external perspective view of a capacitor according to Embodiment 1 of the present invention.
- FIG. 2A is a sectional structural view taken along line A-A of FIG. 1, and
- FIG. 2B is an enlarged view of a main part of FIG. 2A.
- FIG. 2C is an enlarged view of an essential part showing the upper surface part of another example of the capacitor in this embodiment.
- FIG. 3A is a cross-sectional structural view of another example capacitor according to the present embodiment, and FIG. 3B is a cross-sectional structural view of another example capacitor.
- a valve metal sheet (hereinafter referred to as a sheet) 1 has a porous layer 6 in which a large number of micropores are formed on the first surface 1A side.
- a dielectric film 31 is formed on the surface of 6. These are formed, for example, by subjecting aluminum (A1) to chemical treatment and thermal oxidation treatment.
- A1 aluminum
- Ta tantalum
- Nb niobium
- a solid electrolyte layer 32 is formed on the surface of the dielectric film 31.
- the solid electrolyte layer 32 is not shown in FIG. 2A.
- a current collector layer 7 is formed on the surface of the solid electrolyte layer 32.
- the current collector layer 7 is composed of a carbon layer 33 and a cathode electrode layer 9 made of silver (Ag) paste or the like formed thereon.
- the solid electrolyte layer 32 can be formed by a polymerization method of a conductive polymer such as polypyrrole or polythiophen.
- the carbon layer 33 is used to reduce the interface resistance between the solid electrolyte layer 32 and the cathode electrode layer 9.
- the sheet 1 is provided with a first through-hole electrode 2 that penetrates the sheet 1 on the side of the first surface 1A and also on the side of the second surface 1B facing the first surface 1A.
- the through hole electrode 2 and the cathode electrode layer 9 are electrically connected.
- An insulating film 3 is formed on the inner wall of the through hole electrode 2 and most of the second surface side of the sheet 1, and the insulating film 3 insulates the through hole electrode 2 from the sheet 1.
- the cathode separation part 8 formed on the outer peripheral part on the first surface 1A side of the sheet 1 prevents the solid electrolyte layer 32 and the current collector layer 7 from conducting to the sheet 1 at the end part, The reliability of the capacitor is enhanced.
- the reinforcing plate 10 bonded onto the cathode electrode layer 9 enhances the overall mechanical strength.
- the positive and negative electrode separation portion 8 and the reinforcing plate 10 may be provided as necessary, and this is not an essential configuration.
- a cathode terminal 4 is formed on the exposed surface of the through-hole electrode 2 on the second surface IB side of the sheet 1.
- An opening is provided in a part of the insulating film 3 formed on the second surface 1B of the sheet 1, and an anode terminal 5 electrically connected to the sheet 1 is provided in the opening.
- the terminals 4 and 5 are not necessarily required, the provision of the terminals 4 and 5 improves the reliability of the connection.
- the first capacitor element 41 is formed by the above configuration.
- the capacitor element 42 is provided on the second surface 1 B side of the sheet 1 constituting the capacitor element 41.
- the lower electrode 14 which is also a metal having excellent conductivity such as copper (Cu) is provided so as to be connected to the cathode terminal 4 of the capacitor element 41 by using a thin film process or the like.
- a dielectric layer 16 made of a dielectric material thin film such as barium titanate is provided on the lower electrode 14 by a sputtering method or the like.
- the upper electrode 15 is provided on the dielectric layer 16 so as to be connected to the anode terminal 5 of the capacitor element 41.
- the lower electrode 14, the dielectric layer 16 and the upper electrode 15 are stacked.
- the lower electrode 14 is directly connected to the through electrode 2 and the upper electrode 15 is directly connected to the sheet 1. That is, the lower electrode 14 which is the first electrode and the upper electrode 15 which is the second electrode are provided so as to be mutually insulated via the dielectric layer 16, the lower electrode 14 is a through hole electrode 2, and the upper electrode 15 is Each sheet 1 is electrically connected.
- a through hole is formed in the dielectric layer 16 and a part of the upper electrode 15, and a second through hole electrode 18 connected to the lower electrode 14 is provided in the through hole!
- An insulating portion 17 provided on the inner wall of the through hole electrically insulates the through hole electrode 18 from the upper electrode 15. That is, the through hole electrode 18 is provided through the dielectric layer 16 and is insulated from the upper electrode 15 as well as connected to the lower electrode 14. If necessary, a first terminal electrode 20 exposed to the outer surface 21 A and connected to the through electrode 18 is provided on the sulfone electrode 18. In addition, a second terminal electrode 19 exposed to the outer surface 21 A and connected at an extraction portion from the upper electrode 15 is provided on the upper electrode 15.
- the capacitor element 42 is configured as described above!
- capacitor element 42 The characteristic of capacitor element 42 is that the electrode removal portion of upper electrode 15 exposed on outer surface 21 A of insulating and protective layer 21 and the electrode removal from through hole electrode 18 connected from lower electrode 14 It is in the arrangement with the outlet.
- this electrode lead-out portion corresponds to the terminal electrodes 19 and 20, respectively.
- a plurality of terminal electrodes 19 and 20 are provided so as to be in an alternate positional relationship.
- the through hole electrode 18 may be exposed to the outer surface 21A, and a convex portion integrated with the upper electrode 15 may be provided at a position corresponding to the terminal electrode 19. With such a configuration, the ESL of the capacitor element 42 becomes very low.
- a capacitor having capacitor elements 41 and 42 and having the above-described configuration can be used as a decoupling capacitor such as, for example, an MPU.
- the power supply capability which plays an important role in the early stage for the steep voltage change of the MPU, is determined by the ESL characteristics.
- a capacitor that plays a role of power supply required for this initial stage is required to have low ESL characteristics, and the necessary capacitance is about 50 nF. Therefore, it is necessary to shorten the current path length of the capacitor element 42 in the present embodiment as much as possible. In addition, it is necessary to design low ESL characteristics with top priority by devising the arrangement of terminal electrodes 19 and 20. These conditions are satisfied by the configuration of the capacitor element 42 as described above, and by designing the capacitance of the capacitor element 42 to be about 50 nF or more, it is possible to supply power necessary for the initial stage.
- capacitor element 41 supplies a large amount of charge. Therefore, the capacitor element 41 needs a capacitor with low equivalent series resistance (low ESR) characteristics and a large capacity. Since the capacitor element 41 is a solid electrolytic capacitor, it is most suitable for such a large capacity application.
- capacitor element 41 has a large electrostatic capacitance, and capacitor element 42 has a low ESL characteristic.
- capacitor element 42 has a thin film capacitor in which the dielectric layer 16 and the electrodes 14 and 15 are formed by the thin film formation method as described above.
- the pitch between the terminal electrode 19 and the terminal electrode 20 can be made high with a fine pitch dimension. Can be realized on a timely basis.
- the capacitor element 42 is formed by direct film formation on the capacitor element 41 using a thin film process.
- a capacitor having the same function as that of the capacitor element 42 may be separately manufactured and laminated on the capacitor element 41.
- the respective combinations of the cathode terminal 4 and the lower electrode 14, and the anode terminal 5 and the upper electrode 15 are electrically connected by Ag, Cu paste or anisotropic conductive paste.
- the reliability is enhanced by bonding the capacitor element 41 and the capacitor element 42 with an adhesive or the like. In the case of manufacturing in this manner, since the capacitor elements manufactured separately are finally laminated and joined, the yield of the final product is increased.
- the capacitor element 42 When the capacitor element 42 is formed of an organic film capacitor, a capacitor having excellent stress resistance can be obtained. If the capacitor element 42 is formed of a ceramic capacitor, a capacitor having low ESR characteristics and low ESL characteristics can be obtained. If the capacitor element 42 is configured by a solid electrolytic capacitor, the capacitor element 42 can be manufactured by the same process as the capacitor element 41, and a large-capacity capacitor with excellent productivity can be obtained.
- connection bumps 36 on the terminal electrodes 19 and 20. If the terminal electrodes 19 and 20 are not provided, the connection bumps 36 may be provided on the through hole electrode 18 and the lead-out portion of the upper electrode 15. This enables direct connection between the semiconductor device and the capacitor element 42 at the shortest distance, and the performance of power supply in a high frequency range is enhanced. Further, by making the distance between the terminal electrodes 19 and 20 of the capacitor element 42 smaller than the distance between the anode terminal 5 and the cathode terminal 4 of the capacitor element 41, a capacitor excellent in low ESL characteristics can be obtained.
- the cathode terminal 4 and the lower electrode 14 by soldering and connecting the anode terminal 5 and the upper electrode 15 by soldering, the mounting property and the reliability are improved. Further, productivity is improved by connecting the cathode terminal 4 and the lower electrode 14 with a conductive adhesive and connecting the anode terminal 5 and the upper electrode 15 with a conductive adhesive. Further, each combination of the anode terminal 5 and the upper electrode 15, and the cathode terminal 4 and the lower electrode 14 may be connected with an anisotropic conductive paste. Thus, the terminal electrodes 19 and 20 can be arranged at a narrow pitch. Further, by forming the sheet 1 of any of Al, Ta and Nb, a large capacity capacitor can be obtained by the conventional technique.
- the conductive paste is mainly used. Productivity is improved. If necessary, they should be made of different materials.
- FIG. 3A differs from the capacitor shown in FIG. 1 in that the substrate 11 is provided between the capacitor elements 41 and 42.
- the solid electrolyte layer is illustrated as well as Fig. 2A.
- a first through electrode 12 and a second through electrode 13 are provided on the substrate 11.
- the through electrode 13 is provided to be connected to the lower electrode 14, and the dielectric layer 16 is provided on the lower electrode 14.
- the upper electrode 15 is provided on the dielectric layer 16, and the upper electrode 15 is connected to the through electrode 12.
- the cathode terminal 4 and the anode terminal 5 are connected to the through electrodes 13 and 12 respectively. That is, the through-hole electrode 2 and the lower electrode 14 are electrically connected through the through electrode 13, and the sheet 1 and the upper electrode 15 are electrically connected through the through electrode 12.
- the terminal electrodes 19 and 20 of the capacitor element 42 have the same electrode arrangement as in FIG. 2A. As described above, the yield is enhanced by bonding the capacitor elements satisfying the respective characteristics.
- the capacitor element 42 is formed on the substrate 11, and then this connection body is connected and mounted on the capacitor element 41.
- the capacitor element 42 can be formed on the substrate 11 using a thin film method. Then, after inspecting the characteristics of the capacitor element 42, by mounting it on the capacitor element 41 while observing the characteristics, a capacitor with desired characteristics can be obtained efficiently with high precision. Further, by forming the insulating substrate 11 of an organic material, the production efficiency is improved. By using an organic material containing at least one of polyimide resin, epoxy resin, phenol resin, silicon resin and the like as the organic material, the reliability and productivity are improved.
- the substrate 11 may be made of an inorganic material! / ⁇ .
- alumina, glass, quartz and ceramic By using an insulating material containing any one of them, a capacitor with high reliability such as heat resistance can be obtained.
- a conductive metal material such as Cu, Ag, silicon (Si) or the like may be used for the substrate 11.
- the expansion coefficient of the sheet 1 of the capacitor element 41, which is also made of metal, and the expansion coefficient of the substrate 11 become close to each other. Therefore, the reliability is enhanced and the heat dissipation is also enhanced.
- the solid electrolyte layer is not shown in FIG. 3B as in FIG. 2A.
- the substrate 11 is made of a conductive material
- one of the through electrodes 12 and 13 can be omitted.
- the insulating film 37 it is necessary to provide the insulating film 37 so that the upper electrode 15 and the through electrode 12 do not conduct with the substrate 11.
- a Cu substrate is used as the substrate 11, and through holes are provided by dry etching.
- the lower electrode 14 and the dielectric layer 16 are sequentially formed on the substrate 11 by a method such as sputtering or vapor deposition.
- the insulating film 37 is formed by forming a part of the dielectric layer 16 also in the through hole and around the through hole.
- the through electrode 12 is formed by Ag nano paste or the like in the through hole.
- the upper electrode 15 is formed by a method such as sputtering or vapor deposition. In this way, the capacitor element 42 can be laminated in the form of a uniform thin film.
- the whole may be heat treated and oxidized to form an insulating film of oxide on the surface of the substrate 11. .
- productivity is improved by bonding substrate 11 and capacitor element 41 with an adhesive.
- the sheet 1 having the porous layer 6 formed on the first surface 1A is prepared.
- the porous layer 6 is obtained by subjecting the sheet 1 such as A1 to an acid treatment and a thermal oxidation treatment. By these treatments, the dielectric layer 31 is also formed on the surface of the porous layer 6.
- a through hole 2A is formed on the sheet 1 by punching karoe or the like.
- an insulating material 3A made of a resin material is applied from the second surface 1B side of the sheet 1. At this time, the resin material 3A is also filled in the through hole 2A together with the surface on the second surface 1B side of the sheet 1.
- the first sheet 1 The holes are made again in the through holes 2A by injecting air from the side 1A side to remove the excess resin material 3A in the through holes 2A. Then, the resin material 3A is cured by heating.
- the insulating film 3 in FIG. 3A can be formed in this manner.
- a resin is applied to the outer peripheral portion on the first surface 1 A side of the sheet 1 as necessary, and the resin is cured to form the positive and negative electrode separation portion 8.
- a solid electrolyte layer 32 is formed on the dielectric layer 31 by a conductive polymer film such as polythiophen by an inductive polymerization method, an electrolytic polymerization method, or the like.
- a carbon paste is applied thereon and cured to form a thin carbon layer 33.
- an Ag paste is applied and filled on the carbon layer 33 and the inside of the through hole 2A to form a through hole electrode 2 and a cathode electrode layer 9.
- a conductive reinforcing plate 10 which also has a force such as Ag or Cu may be adhered to the cathode electrode layer 9 with an Ag paste.
- the anode opening 5 A is formed by covering a predetermined position of the insulating film 3 with a laser cover or the like to expose the surface layer of the sheet 1. Thereafter, as shown in FIG. 7, terminals 4 and 5 are formed on the exposed surface of the hole electrode 2 and the anode opening 5A by plating or the like. As described above, the capacitor element 41 is formed.
- a method of manufacturing the capacitor element 42 on the substrate 11 will be described with reference to FIGS. 8 to 13.
- a resist (not shown) or the like that is patterned is formed on a substrate 11 that is a flat plate of Si, and then through holes 12A and 13A are formed at predetermined portions by a dry etching method or the like.
- the insulating film of SiO is formed on the surface of the substrate 11 by heat-treating the substrate 11 (see FIG.
- through-holes 12 and 13 are formed by filling Ag nanopaste etc. in through holes 12A and 13A and curing them.
- a lower electrode 14 composed of Cu, a dielectric layer 16 composed mainly of barium titanate, and an upper electrode 15 composed of Cu are sequentially formed by sputtering or the like. Each of these is formed into a predetermined shape by a photolithographic method or an etching method after forming a film-forming force on the entire surface or forming a film-forming force by a metal mask.
- blind vias 18A are formed at predetermined positions.
- blind A laser etching method is used to form the via 18A.
- the insulating portion 17 is formed on the inner wall of the blind via 18A.
- the insulating portion 17 can be formed, for example, by performing post-exposure development and main curing so that the polyimide remains only at a predetermined site after temporary curing using photosensitive polyimide or the like.
- the capacitor element 42 is manufactured.
- the terminal electrodes 19 and 20 can be formed by sputtering, photolithography and etching.
- the capacitor elements 41 and 42 described above are stacked and connected via the substrate 11. At this time, the cathode terminal 4 and the lower electrode 14 are connected to each other via the through electrode 13 and the anode terminal 5 and the upper electrode 15 are connected to each other by the paste or the like so as to be conductive through the through electrode 12. Thus, the capacitor is completed.
- the insulating protection layer 21 as shown in FIG. 3A as necessary, it is possible to manufacture a capacitor with improved reliability and demonstration.
- the capacitor element 42 realizes low ESL characteristics, and the capacitor element 41 secures a large capacity. Therefore, a capacitor excellent in high frequency characteristics can be obtained.
- the combination of capacitor elements with different characteristics in this way makes it possible to use for various applications. That is, each of these capacitor elements has a through hole electrode inside, so that the flow of current in the opposite direction is derived inside, so that the magnetic field due to the current can be offset by itself. This minimizes the ESL value caused by the magnetic field. In particular, since the plurality of sulfo electrodes 18 are formed on the capacitor element 42, the effect is remarkable. By combining the capacitor element 42 and the capacitor element 41 having a large capacity, it is possible to apply to electronic devices that require highly accurate mounting technology.
- FIG. 14 is a cross-sectional view of a capacitor in a second embodiment of the present invention.
- the capacitor element 41 is the same as that of the first embodiment.
- Capacitor element 43 which is the second capacitor element differs from capacitor element 42 in the first embodiment in that capacitor element 43 It is a point having a laminated structure.
- the solid electrolyte layer is not illustrated in FIG. 14 as in FIG. 2A.
- the inner layer electrode 34 as the first electrode and the inner layer electrode 35 as the second electrode are provided in the inner layer of the dielectric layer 16.
- the inner layer electrode 34 and the inner layer electrode 35 are alternately stacked via the dielectric layer 16.
- the second through hole electrode 22 is electrically connected to the inner layer electrode 34
- the third through hole electrode (hereinafter referred to as through hole electrode) 23 is electrically connected to the inner layer electrode 35 and is insulated from the inner layer electrode 34.
- the through-hole electrodes 22 and 23 penetrate the dielectric layer 16 viewed macroscopically.
- the inner layer electrode 34 and the inner layer electrode 35 are patterned so as not to short each other through the through hole electrodes 22 and 23.
- the respective through-hole electrodes 22 appear to be isolated from each other, and they are electrically connected by a plurality of inner layer electrodes 34.
- Terminal electrodes 19 and 20 are provided on the outer surface 21 A side of each of the inner layer electrodes 34 and 35.
- one of the through-hole electrodes 23 is connected to the anode terminal 5 of the capacitor element 41, and one of the through-hole electrodes 22 is connected to the cathode terminal 4.
- the inner layer electrode 34 is connected to the anode terminal 5 of the capacitor element 41, and the inner layer electrode 35 is connected to the cathode terminal 4.
- a thin film capacitor, an organic film capacitor, a laminated ceramic capacitor, etc. can be used as the capacitor element 43 having such a laminated structure.
- the capacitor according to the present invention is excellent in productivity, and is capable of achieving low ESL and large capacity. Therefore, it can be applied to applications such as electronic devices that require low impedance characteristics such as decoupling capacitors such as MPU.
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- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Abstract
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP05758330A EP1768138A4 (en) | 2004-07-15 | 2005-07-07 | CAPACITOR |
US11/597,812 US7443655B2 (en) | 2004-07-15 | 2005-07-07 | Capacitor |
JP2006528963A JP4341676B2 (ja) | 2004-07-15 | 2005-07-07 | コンデンサ |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004208148 | 2004-07-15 | ||
JP2004-208148 | 2004-07-15 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2006008973A1 true WO2006008973A1 (ja) | 2006-01-26 |
Family
ID=35785092
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2005/012553 Ceased WO2006008973A1 (ja) | 2004-07-15 | 2005-07-07 | コンデンサ |
Country Status (5)
Country | Link |
---|---|
US (1) | US7443655B2 (ja) |
EP (1) | EP1768138A4 (ja) |
JP (1) | JP4341676B2 (ja) |
CN (1) | CN1998056A (ja) |
WO (1) | WO2006008973A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2022150913A (ja) * | 2021-03-26 | 2022-10-07 | Tdk株式会社 | 積層コイル部品の製造方法及び積層コイル部品 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107946074A (zh) * | 2017-12-26 | 2018-04-20 | 广州天极电子科技有限公司 | 一种单层电容器及制备方法 |
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JPH08138974A (ja) * | 1994-11-14 | 1996-05-31 | Showa Denko Kk | 積層型コンデンサ |
JP2001185442A (ja) * | 1999-12-27 | 2001-07-06 | Murata Mfg Co Ltd | 積層コンデンサ、デカップリングコンデンサの接続構造および配線基板 |
JP2003045762A (ja) * | 2001-07-31 | 2003-02-14 | Matsushita Electric Ind Co Ltd | 回路モジュール |
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US5517385A (en) * | 1992-11-19 | 1996-05-14 | International Business Machines Corporation | Decoupling capacitor structure |
JP2001189234A (ja) * | 1999-12-28 | 2001-07-10 | Tdk Corp | 積層コンデンサ |
JP4432207B2 (ja) * | 2000-05-25 | 2010-03-17 | パナソニック株式会社 | コンデンサ |
JP2002299152A (ja) | 2001-03-29 | 2002-10-11 | Kyocera Corp | コンデンサ |
US6756628B2 (en) * | 2001-05-30 | 2004-06-29 | Matsushita Electric Industrial Co., Ltd. | Capacitor sheet with built in capacitors |
JP4604403B2 (ja) * | 2001-06-25 | 2011-01-05 | パナソニック株式会社 | 固体電解コンデンサの製造方法 |
CN100339918C (zh) * | 2001-07-17 | 2007-09-26 | 松下电器产业株式会社 | 固体电解电容器的制造方法 |
JP4214763B2 (ja) * | 2002-11-11 | 2009-01-28 | パナソニック株式会社 | 固体電解コンデンサ |
US6870728B1 (en) * | 2004-01-29 | 2005-03-22 | Tdk Corporation | Electrolytic capacitor |
-
2005
- 2005-07-07 JP JP2006528963A patent/JP4341676B2/ja not_active Expired - Fee Related
- 2005-07-07 US US11/597,812 patent/US7443655B2/en not_active Expired - Fee Related
- 2005-07-07 EP EP05758330A patent/EP1768138A4/en not_active Withdrawn
- 2005-07-07 CN CNA2005800224213A patent/CN1998056A/zh active Pending
- 2005-07-07 WO PCT/JP2005/012553 patent/WO2006008973A1/ja not_active Ceased
Patent Citations (4)
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JPH08138974A (ja) * | 1994-11-14 | 1996-05-31 | Showa Denko Kk | 積層型コンデンサ |
JP2001185442A (ja) * | 1999-12-27 | 2001-07-06 | Murata Mfg Co Ltd | 積層コンデンサ、デカップリングコンデンサの接続構造および配線基板 |
JP2003051427A (ja) * | 2001-05-30 | 2003-02-21 | Matsushita Electric Ind Co Ltd | キャパシタシートおよびその製造方法、キャパシタ内蔵基板、ならびに半導体装置 |
JP2003045762A (ja) * | 2001-07-31 | 2003-02-14 | Matsushita Electric Ind Co Ltd | 回路モジュール |
Cited By (1)
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JP2022150913A (ja) * | 2021-03-26 | 2022-10-07 | Tdk株式会社 | 積層コイル部品の製造方法及び積層コイル部品 |
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EP1768138A4 (en) | 2010-09-22 |
JP4341676B2 (ja) | 2009-10-07 |
CN1998056A (zh) | 2007-07-11 |
JPWO2006008973A1 (ja) | 2008-05-01 |
US20080024955A1 (en) | 2008-01-31 |
US7443655B2 (en) | 2008-10-28 |
EP1768138A1 (en) | 2007-03-28 |
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